Designing Adaptive Multiple Dependent State Sampling Plan for Accelerated Life Tests

A novel adaptive multiple dependent state sampling plan (AMDSSP) was designed to inspect products from a continuous manufacturing process under the accelerated life test (ALT) using both double (DSP) and (MDSSP) concepts. Under conditions, lifetime of product follows Weibull distribution with known shape parameter, while scale parameter can be determined acceleration factor (AF). The Arrhenius model is used estimate AF when damaging temperature-sensitive. An economic design proposed also considered for ALT. genetic algorithm nonlinear optimization optimal parameters minimize average sample number (ASN) total cost inspection (TC) producer’s consumer’s risks. Numerical results are presented support AMDSSP ALT, performance comparisons between AMDSSP, MDSSP single (SSP) ALT discussed. Results indicated that more flexible efficient ASN TC than SSP plans conditions. had higher operating characteristic (OC) curve existing plans. Two real datasets electronic devices at high temperatures demonstrated practicality usefulness plan.